Ellipso

Scanning Ellipsometry Services

PVD Products has a FilmSense FS-1 four-color ellipsometer with a scanning stage capable of measuring samples up to 12" (300 mm) diameter. Besides dielectric film thickness, this unit can provide optical constants at four wavelengths. 

Please contact us with your requirements

Scanning Ellipsometry for Film Thickness Mapping

Ellipsometry is a highly sensitive, non-destructive method for measuring film thickness across a substrate. It can also determine the real and imaginary indices of refraction. Coupled with our high-precision, dual axis stepper-motor stage, we can provide film mapping down to the resolution of the light source spot size (approximately 3-5 mm).

What Our Clients Say

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“PVD has a good response time. They’re always aware of what can and can’t work, and willing to do exploratory projects.”

John Smythe, Advanced Technology Lead, Micron Technology

Since all of our depositions systems are custom, we may not have a system in our facility that will fill your needs, but it never hurts to ask! Check out what we are working with right now:


A custom deposition system being built in our facility


A custom sputtering system for commercial processes and testing

PVD is committed to your unique deposition requirements, not just before delivery, but also during and after. Learn more about planning for installation and our ongoing service and maintenance.
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