PVD Products provides thin film deposition services. We can deposit thin films using magnetron sputtering, PLD and electron beam evaporation on an as-needed basis for R&D applications. We utilize in-house equipment that can be modified in some cases to meet the customer's needs. We have an in-house PLD/MBE 2300 system with both PLD and magnetron sputtering capability for 2-inch diameter wafers. Substrate heating to 950ºC is readily available. We also have an in-house sputtering tool capable of handling wafers up to 6 inches in diameter. We have an electron beam evaporation system capable of coating up to eight six-inch wafers simultaneously. We have a reel-to-reel sputtering system for depositing continuously on moving tape or wire for process development or pilot production.
The SEM services provided by PVD Products offer the benefits of production quality monitoring and troubleshooting, failure evaluation, process parameter evaluation, and R&D assistance for new products. All data is provided to the customer on a compact disc or can be downloaded to your computer from our secure FTP site.
Thin Film Deposition
PVD Products provides thin film deposition services including magnetron sputtering, PLD and electron beam evaporation for R&D applications such as combinatorial deposition or new materials development.
Deposition System Design
PVD Products provides complete 3-D Solid Models of Custom Deposition System Designs as a service for your prototype or custom thin film deposition or vacuum chamber needs. These services include: mechanical design using Solid Works electronics design for motion control, power distribution, data acquisition, and cabling software for system control such as LabVIEW.
Deposition Software Design
A customized vacuum deposition system requires customized software to control the hardware, acquire the data, and interface with existing laboratory equipment. For every system we build, we work with you to design a software package that meets your needs, current and future.
PVD Products has a four-color ellipsometer with a scanning stage capable of handling substrates up to 12" in diameter. This is useful for non-destructive characterization of film thickness and other properties. We can map your films and provide files with property data.