X-Ray Analysis
X-Ray analysis has proven to be very informative when run in combination with scanning
electron microscopy (why?). For this reason,
PVD Products offers such analysis in conjunction with SEM services.
X-Ray Analytical Equipment and Software
- Noran System Six with Light Element Detector
- Resolution of 128.0ev at Mn FWHM
- Element detection to 0.3% weight mass
- Instant qualitative and quantitative data generation
- "Point and Shoot" capabilities — grab images and perform analysis in one step
- Spectral Imaging — X-Ray data stored for every pixel for easy analysis of
large areas
- Analog and rapid digital X-Ray mapping
- All data and spectra easily exported to standard formats
SEM micrograph of the contaminated wafer
EDS spectrum of contamination on a wafer